AD5570
TERMINOLOGY
Relative Accuracy or Integral Nonlinearity (INL)
Rev. 0 | Page 10 of 24
Relative accuracy or integral nonlinearity is a measure of the
maximum deviation, in LSBs, from a straight line passing
through the endpoints of the DAC transfer function.
Monotonicity
A DAC is monotonic, if the output either increases or remains
constant for increasing digital inputs. The AD5570 is monotonic
over its full operating temperature range.
Differential Nonlinearity (DNL)
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent
codes. A specified differential nonlinearity of ±1 LSB maximum
ensures monotonicity.
Gain Error
Gain error is the difference between the actual and ideal analog
output range, expressed as a percent of the full-scale range. It is
the deviation in slope of the DAC transfer characteristic from
the ideal.
Gain Error Temperature Coefficient
Gain error temperature coefficient is a measure of the change in
gain error with changes in temperature. It is expressed in
ppm/°C.
Negative Full-Scale Error / Zero Scale Error
Negative full-scale error is the error in the DAC output voltage
when all 0s are loaded into the DAC latch. Ideally, the output
voltage, with all 0s in the DAC latch, should be 2 V
REF
.
Full-Scale Error
Full-scale error is the error in the DAC output voltage when all
1s are loaded to the DAC latch. Ideally the output voltage, with
all 1s loaded into the DAC latch, should be 2 V
REF
1 LSB.
Bipolar Zero Error
Bipolar zero error is the deviation of the analog input from the
ideal half-scale output of 0.0000 V when the inputs are loaded
with 0x8000.
Output Voltage Settling Time
Output voltage settling time is the amount of time it takes for
the output to settle to a specified level for a full-scale input
change.
Slew Rate
The slew rate of a device is a limitation in the rate of change of
output voltage. The output slewing speed of a voltage-output
D/A converter is usually limited by the slew rate of the amplifier
used at its output. Slew rate is measured from 10% to 90% of the
output signal and is given in V/μs.
Digital-to-Analog Glitch Impulse
Digital-to-analog glitch impulse is the amount of charge in-
jected into the analog output when the input codes in the DAC
register change state. It is specified as the area of the glitch in
nV-s and is measured when the digital input code changes by
1 LSB at the major carry transition, that is, from code 0x7FFF to
0x8000.
Bandwidth
The reference amplifiers within the DAC have a finite band-
width to optimize noise performance. To measure it, a sine
wave is applied to the reference input (REFIN), with full-scale
code loaded to the DAC. The bandwidth is the frequency at
which the output amplitude falls to 3 dB below the input.
Digital Feedthrough
Digital feedthrough is a measure of the impulse injected into
the analog output of the DAC from the digital inputs of the
DAC, but is measured when the DAC output is not updated.
SYNC is held high, while the CLK and SDIN signals are toggled.
It is specified in nV-s and is measured with a full-scale code
change on the data bus, that is, from all 0s to all 1s and vice
versa.
Power Supply Sensitivity
Power supply sensitivity indicates how the output of the DAC is
affected by changes in the power supply voltage.
相关PDF资料
EVAL-AD5620EB Single, 12-/14-/16-Bit nanoDAC with 5 ppm/C On-Chip Reference in SOT-23
EVAL-AD5663REB Dual 12-/14-/16-Bit nanoDAC with 5 ppm/C On-Chip Reference
EVAL-AD5664REB Quad, 12-/14-/16-Bit nanoDACs with 5 ppm/C On-Chip Reference
EVAL-AD5666EB Quad, 16-Bit DAC with 5 ppm/C On-Chip Reference in 14-Lead TSSOP
EVAL-AD5680EB 5 V 18-Bit nanoDAC in a SOT-23
EVAL-AD5821EBZ1 120 mA, Current Sinking, 10-Bit, I2C DAC
EVAL-AD5930EB Programmable Frequency Sweep and Output Burst Waveform Generator
EVAL-AD5932EB Programmable Frequency Scan Waveform Generator
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